On wires at low electron densities

Valeriu Beiu, Walid Ibrahim, Rafic Z. Makki

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)


    When analyzing reliability, wires have in most cases been ignored, with gates taking the lion's share, and devices being considered only once in a while. With scaling, this "only-computations-fail" approach is not going to be accurate enough as wires will also start to err. Trying to do justice to communication (wires), this paper details a statistical failure analysis of wires following on the few papers which have made wires' reliability their concern. We will use a classical particle-like probabilistic approach to enhance on the accuracy of wires' length-dependent probabilities of failure due to the discreetness of charge. Covering some of the intrinsic noises, such an approach leads to "lower bound"-like wire reliability estimates, as ignoring other intrinsic noises, as well as extrinsic noises, variations, and defects. These results should have implications for design strategies of multi-/many-cores and networks-on-chip, as well as for forward-looking investigations on emerging nano-architectures.

    Original languageEnglish
    Title of host publication2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009
    Number of pages4
    Publication statusPublished - 2009
    Event2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009 - Genoa, Italy
    Duration: Jul 26 2009Jul 30 2009

    Publication series

    Name2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009


    Other2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009


    • Communication
    • Interconnects
    • Nano-electronics
    • Noise (intrinsic)
    • Reliability
    • Wires

    ASJC Scopus subject areas

    • Process Chemistry and Technology
    • Electrical and Electronic Engineering


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