TY - GEN
T1 - On wires holding a handful of electrons
AU - Beiu, Valeriu
AU - Ibrahim, Walid
AU - Makki, Rafic Z.
PY - 2009
Y1 - 2009
N2 - When analyzing reliability, wires have in most cases been ignored, with gates (and devices) taking the lion's share. With scaling, this "only computing fails" approach is not going to be accurate enough as communication (wires) will also start to err. Trying to do justice to wires, this paper details a statistical failure analysis of wires following on the few papers which have made wires' reliability their concern. We will use a classical particle-like probabilistic approach to enhance on the accuracy of wires' length-dependent probabilities of failure due to the discreetness of charge. Covering some of the intrinsic noises, such an approach leads to "lower bound"-like wire reliability estimates, as ignoring other intrinsic noises, as well as extrinsic noises, variations, and defects. These results should have implications for multi-/many-cores and networks-on-chip, as well as forward-looking investigations on emerging nano-architectures.
AB - When analyzing reliability, wires have in most cases been ignored, with gates (and devices) taking the lion's share. With scaling, this "only computing fails" approach is not going to be accurate enough as communication (wires) will also start to err. Trying to do justice to wires, this paper details a statistical failure analysis of wires following on the few papers which have made wires' reliability their concern. We will use a classical particle-like probabilistic approach to enhance on the accuracy of wires' length-dependent probabilities of failure due to the discreetness of charge. Covering some of the intrinsic noises, such an approach leads to "lower bound"-like wire reliability estimates, as ignoring other intrinsic noises, as well as extrinsic noises, variations, and defects. These results should have implications for multi-/many-cores and networks-on-chip, as well as forward-looking investigations on emerging nano-architectures.
KW - Communication
KW - Interconnects (wires)
KW - Nano-electronics
KW - Noise (intrinsic)
KW - Reliability
UR - http://www.scopus.com/inward/record.url?scp=84885890314&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84885890314&partnerID=8YFLogxK
U2 - 10.1007/978-3-642-04850-0_34
DO - 10.1007/978-3-642-04850-0_34
M3 - Conference contribution
AN - SCOPUS:84885890314
SN - 3642048498
SN - 9783642048494
T3 - Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering
SP - 259
EP - 269
BT - Nano-Net - 4th International ICST Conference, Nano-Net 2009, Proceedings
T2 - 4th International ICST Conference on Nano-Net, Nano-Net 2009
Y2 - 18 October 2009 through 20 October 2009
ER -