On wires holding a handful of electrons

Valeriu Beiu, Walid Ibrahim, Rafic Z. Makki

    Research output: Chapter in Book/Report/Conference proceedingConference contribution


    When analyzing reliability, wires have in most cases been ignored, with gates (and devices) taking the lion's share. With scaling, this "only computing fails" approach is not going to be accurate enough as communication (wires) will also start to err. Trying to do justice to wires, this paper details a statistical failure analysis of wires following on the few papers which have made wires' reliability their concern. We will use a classical particle-like probabilistic approach to enhance on the accuracy of wires' length-dependent probabilities of failure due to the discreetness of charge. Covering some of the intrinsic noises, such an approach leads to "lower bound"-like wire reliability estimates, as ignoring other intrinsic noises, as well as extrinsic noises, variations, and defects. These results should have implications for multi-/many-cores and networks-on-chip, as well as forward-looking investigations on emerging nano-architectures.

    Original languageEnglish
    Title of host publicationNano-Net - 4th International ICST Conference, Nano-Net 2009, Proceedings
    Number of pages11
    Publication statusPublished - 2009
    Event4th International ICST Conference on Nano-Net, Nano-Net 2009 - Lucerne, Switzerland
    Duration: Oct 18 2009Oct 20 2009

    Publication series

    NameLecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering
    Volume20 LNICST
    ISSN (Print)1867-8211


    Other4th International ICST Conference on Nano-Net, Nano-Net 2009


    • Communication
    • Interconnects (wires)
    • Nano-electronics
    • Noise (intrinsic)
    • Reliability

    ASJC Scopus subject areas

    • Computer Networks and Communications


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