TY - JOUR
T1 - Optical and structural characteristics of pulsed DC magnetron sputtered Ce1−xTixOy coatings
AU - Miran, Hussein A.
AU - Jaf, Zainab N.
AU - Altarawneh, Mohammednoor
AU - Rahman, M. Mahbubur
AU - Jiang, Zhong Tao
AU - Zhou, Zhifeng
N1 - Funding Information:
Hussein Miran and Zainab Jaf acknowledge the support provided by the University of Baghdad-College of Education for pure science/ Ibn-Al-Haitham. Mohammednoor Al-tarawneh gratefully thanks department of chemical and petroleum engineering, United Arab Emirates University. M Mahbubur Rahman gratefully acknowledges the supports offered by the University Grants Commission of Bangladesh and Faculty of Mathematical and Physical Sciences at Jahangirnagar University.
Funding Information:
Hussein Miran and Zainab Jaf acknowledge the support provided by the University of Baghdad-College of Education for pure science/ Ibn-Al-Haitham. Mohammednoor Al-tarawneh gratefully thanks department of chemical and petroleum engineering, United Arab Emirates University . M Mahbubur Rahman gratefully acknowledges the supports offered by the University Grants Commission of Bangladesh and Faculty of Mathematical and Physical Sciences at Jahangirnagar University.
Publisher Copyright:
© 2022 Elsevier GmbH
PY - 2022/11
Y1 - 2022/11
N2 - This contribution investigates the impact of adding transition metal of Ti to CeOy samples at various concentrations referring to 0, 15.84, 24.46, 34.46, 36.23, 38.46, 45.38% and pure TiOy, correspondingly. The samples were fabricated by the magnetron sputtering technique. X-ray diffraction (XRD) configurations demonstrate the presence of α-Ce2O3 and Ce2O3 phases with increased Ti contents in the systems. X-ray photoelectron spectroscopy (XPS) experimentation confirms the purity of the S1-sample (CeO2) and the purity of the S8-sample (TiO2). Further XPS analysis reveals that Ti incorporation in the doped systems functions as a reducing agent because of the existence of α-Ce2O3 and Ce2O3 phases. Moreover, based on UV–vis spectroscopy results, the studied samples exhibit indirect optical energy band-gaps reduced from 2.6 to 2.35 eV with the increase of Ti concentrations of 0–45.38% in (S1-S7), respectively. In reference to bandgap 2.35 eV, a slight rise in band gaps was detected for S3 sample. However, an observable increase in the band gap of 2.9 eV occurred for S8 (pure TiO2). Optical analysis of the calculated energy loss parameters demonstrates that all the studied samples reveal small amounts of energy loss. Our results suggest that the improved optical properties of Ti-doped CeOy films could serve for various optical applications.
AB - This contribution investigates the impact of adding transition metal of Ti to CeOy samples at various concentrations referring to 0, 15.84, 24.46, 34.46, 36.23, 38.46, 45.38% and pure TiOy, correspondingly. The samples were fabricated by the magnetron sputtering technique. X-ray diffraction (XRD) configurations demonstrate the presence of α-Ce2O3 and Ce2O3 phases with increased Ti contents in the systems. X-ray photoelectron spectroscopy (XPS) experimentation confirms the purity of the S1-sample (CeO2) and the purity of the S8-sample (TiO2). Further XPS analysis reveals that Ti incorporation in the doped systems functions as a reducing agent because of the existence of α-Ce2O3 and Ce2O3 phases. Moreover, based on UV–vis spectroscopy results, the studied samples exhibit indirect optical energy band-gaps reduced from 2.6 to 2.35 eV with the increase of Ti concentrations of 0–45.38% in (S1-S7), respectively. In reference to bandgap 2.35 eV, a slight rise in band gaps was detected for S3 sample. However, an observable increase in the band gap of 2.9 eV occurred for S8 (pure TiO2). Optical analysis of the calculated energy loss parameters demonstrates that all the studied samples reveal small amounts of energy loss. Our results suggest that the improved optical properties of Ti-doped CeOy films could serve for various optical applications.
KW - Magnetron sputtering
KW - Photocatalysts
KW - Solar cells
KW - Ti addition into ceria
KW - Volume and surface loss energies
KW - XPS
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U2 - 10.1016/j.ijleo.2022.170002
DO - 10.1016/j.ijleo.2022.170002
M3 - Article
AN - SCOPUS:85138157137
SN - 0030-4026
VL - 270
JO - Optik
JF - Optik
M1 - 170002
ER -