Optimal simple step-stress plan for cumulative exposure model using log-normal distribution

Abdulla A. Alhadeed; Shie Shien Yang

doi:10.1109/TR.2004.841704

Optimal simple step-stress plan for cumulative exposure model using log-normal distribution

Abdulla A. Alhadeed, Shie Shien Yang

Research output: Contribution to journal › Article › peer-review

58 Citations (Scopus)

Abstract

Optimal times of changing stress level for simple step-stress plans under a cumulative exposure model using the log-normal distribution are determined for a wide range of values of the parameters in the model. A table of optimal times of changing stress level for various model parameters values is obtained. A formula for optimal time of changing stress level is also estimated from the table. This paper provides an optimal life testing plan which will enable us to accurately estimate the 50th percentile of the life time of a product being tested without having to wait long time for the product to fail.

Original language	English
Pages (from-to)	64-68
Number of pages	5
Journal	IEEE Transactions on Reliability
Volume	54
Issue number	1
DOIs	https://doi.org/10.1109/TR.2004.841704
Publication status	Published - Mar 2005

Keywords

Accelerated test
Cumulative exposure
Log-normal distribution
Maximum likelihood estimation
Step-stress

ASJC Scopus subject areas

Safety, Risk, Reliability and Quality
Electrical and Electronic Engineering

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10.1109/TR.2004.841704

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abstract = "Optimal times of changing stress level for simple step-stress plans under a cumulative exposure model using the log-normal distribution are determined for a wide range of values of the parameters in the model. A table of optimal times of changing stress level for various model parameters values is obtained. A formula for optimal time of changing stress level is also estimated from the table. This paper provides an optimal life testing plan which will enable us to accurately estimate the 50th percentile of the life time of a product being tested without having to wait long time for the product to fail.",

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KW - Log-normal distribution

KW - Maximum likelihood estimation

KW - Step-stress

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Optimal simple step-stress plan for cumulative exposure model using log-normal distribution

Abstract

Keywords

ASJC Scopus subject areas

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