Optimal simple step-stress plan for cumulative exposure model using log-normal distribution

Abdulla A. Alhadeed, Shie Shien Yang

    Research output: Contribution to journalArticlepeer-review

    60 Citations (Scopus)

    Abstract

    Optimal times of changing stress level for simple step-stress plans under a cumulative exposure model using the log-normal distribution are determined for a wide range of values of the parameters in the model. A table of optimal times of changing stress level for various model parameters values is obtained. A formula for optimal time of changing stress level is also estimated from the table. This paper provides an optimal life testing plan which will enable us to accurately estimate the 50th percentile of the life time of a product being tested without having to wait long time for the product to fail.

    Original languageEnglish
    Pages (from-to)64-68
    Number of pages5
    JournalIEEE Transactions on Reliability
    Volume54
    Issue number1
    DOIs
    Publication statusPublished - Mar 2005

    Keywords

    • Accelerated test
    • Cumulative exposure
    • Log-normal distribution
    • Maximum likelihood estimation
    • Step-stress

    ASJC Scopus subject areas

    • Safety, Risk, Reliability and Quality
    • Electrical and Electronic Engineering

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