TY - GEN

T1 - Parameters for modeling digital circuit reliability a statistical perspective

AU - Beg, Azam

AU - Ahmed, Faheem

AU - Elchouemi, Amr

AU - Beg, Ajmal

PY - 2012/10/1

Y1 - 2012/10/1

N2 - This paper presents a statistical perspective on the relationship of the reliability of a nano-circuit (measured by its probability of failure) and the circuit parameters. The study was motivated by our observation that the reliability estimates using (a commonly used set of) mathematical equations deviated appreciably from the results of a Bayesian Network based reliability calculation software, especially as the circuit size increased. (For comparative purposes, we had utilized the data from thousands of randomly generated circuits.) In this research, we have investigated circuit reliability's sensitivity to circuit parameters besides the ones used in the mathematical equations. For this purpose, we formulated several hypotheses regarding circuit parameters and the reliability, and then used statistical metrics to test them. The findings from this analysis are expected to help create higher accuracy mathematical models for predicting circuit reliability.

AB - This paper presents a statistical perspective on the relationship of the reliability of a nano-circuit (measured by its probability of failure) and the circuit parameters. The study was motivated by our observation that the reliability estimates using (a commonly used set of) mathematical equations deviated appreciably from the results of a Bayesian Network based reliability calculation software, especially as the circuit size increased. (For comparative purposes, we had utilized the data from thousands of randomly generated circuits.) In this research, we have investigated circuit reliability's sensitivity to circuit parameters besides the ones used in the mathematical equations. For this purpose, we formulated several hypotheses regarding circuit parameters and the reliability, and then used statistical metrics to test them. The findings from this analysis are expected to help create higher accuracy mathematical models for predicting circuit reliability.

KW - And nanoelectronics

KW - Circuit reliability

KW - Computer aided design

KW - Digital circuit

KW - Monte carlo simulation

KW - Probability of failure

KW - Statistical and probabilistic modeling

UR - http://www.scopus.com/inward/record.url?scp=84866669641&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84866669641&partnerID=8YFLogxK

U2 - 10.2316/P.2012.783-012

DO - 10.2316/P.2012.783-012

M3 - Conference contribution

AN - SCOPUS:84866669641

SN - 9780889869264

T3 - Proceedings of the IASTED International Conference on Modelling and Simulation

SP - 116

EP - 121

BT - Proceedings of the IASTED International Conference on Modelling and Simulation, MS 2012

T2 - IASTED International Conference on Modelling and Simulation, MS 2012

Y2 - 3 July 2012 through 5 July 2012

ER -