TY - GEN
T1 - Parameters for modeling digital circuit reliability a statistical perspective
AU - Beg, Azam
AU - Ahmed, Faheem
AU - Elchouemi, Amr
AU - Beg, Ajmal
PY - 2012
Y1 - 2012
N2 - This paper presents a statistical perspective on the relationship of the reliability of a nano-circuit (measured by its probability of failure) and the circuit parameters. The study was motivated by our observation that the reliability estimates using (a commonly used set of) mathematical equations deviated appreciably from the results of a Bayesian Network based reliability calculation software, especially as the circuit size increased. (For comparative purposes, we had utilized the data from thousands of randomly generated circuits.) In this research, we have investigated circuit reliability's sensitivity to circuit parameters besides the ones used in the mathematical equations. For this purpose, we formulated several hypotheses regarding circuit parameters and the reliability, and then used statistical metrics to test them. The findings from this analysis are expected to help create higher accuracy mathematical models for predicting circuit reliability.
AB - This paper presents a statistical perspective on the relationship of the reliability of a nano-circuit (measured by its probability of failure) and the circuit parameters. The study was motivated by our observation that the reliability estimates using (a commonly used set of) mathematical equations deviated appreciably from the results of a Bayesian Network based reliability calculation software, especially as the circuit size increased. (For comparative purposes, we had utilized the data from thousands of randomly generated circuits.) In this research, we have investigated circuit reliability's sensitivity to circuit parameters besides the ones used in the mathematical equations. For this purpose, we formulated several hypotheses regarding circuit parameters and the reliability, and then used statistical metrics to test them. The findings from this analysis are expected to help create higher accuracy mathematical models for predicting circuit reliability.
KW - And nanoelectronics
KW - Circuit reliability
KW - Computer aided design
KW - Digital circuit
KW - Monte carlo simulation
KW - Probability of failure
KW - Statistical and probabilistic modeling
UR - http://www.scopus.com/inward/record.url?scp=84866669641&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84866669641&partnerID=8YFLogxK
U2 - 10.2316/P.2012.783-012
DO - 10.2316/P.2012.783-012
M3 - Conference contribution
AN - SCOPUS:84866669641
SN - 9780889869264
T3 - Proceedings of the IASTED International Conference on Modelling and Simulation
SP - 116
EP - 121
BT - Proceedings of the IASTED International Conference on Modelling and Simulation, MS 2012
T2 - IASTED International Conference on Modelling and Simulation, MS 2012
Y2 - 3 July 2012 through 5 July 2012
ER -