TY - GEN
T1 - Performance metrics study for repeater-insertion strategies
AU - Awwad, Falah R.
AU - Nekili, Mohamed
AU - Sawan, Mohamad
PY - 2008
Y1 - 2008
N2 - Parallel and serial repeater-insertion strategies use, respectively, parallel and serial repeaters to minimize the propagation delay over global SoC interconnects. General performance trade-offs refer to any combination of silicon area (Area), delay (T), power (P), energy (E) and reliability. In this paper we address the VLSI designs performance metrics within the repeater-insertion strategies. We study the effect of modeling the power, reliability, as well performance trade-offs on the area-delay optimum found using the repeater-insertion strategies. Simulation results using a 0.25 μm TSMC technology show that the parallel repeater-insertion strategy starts achieving a better speed than the non-regenerated interconnect at wire lengths smaller than that achieved when the interconnect is serially regenerated. It also features a 47% time delay saving and a 96% Area-Delay product saving over the serial repeaterinsertion strategy.
AB - Parallel and serial repeater-insertion strategies use, respectively, parallel and serial repeaters to minimize the propagation delay over global SoC interconnects. General performance trade-offs refer to any combination of silicon area (Area), delay (T), power (P), energy (E) and reliability. In this paper we address the VLSI designs performance metrics within the repeater-insertion strategies. We study the effect of modeling the power, reliability, as well performance trade-offs on the area-delay optimum found using the repeater-insertion strategies. Simulation results using a 0.25 μm TSMC technology show that the parallel repeater-insertion strategy starts achieving a better speed than the non-regenerated interconnect at wire lengths smaller than that achieved when the interconnect is serially regenerated. It also features a 47% time delay saving and a 96% Area-Delay product saving over the serial repeaterinsertion strategy.
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U2 - 10.1109/NEWCAS.2008.4606395
DO - 10.1109/NEWCAS.2008.4606395
M3 - Conference contribution
AN - SCOPUS:52449135152
SN - 9781424423323
T3 - 2008 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA
SP - 359
EP - 362
BT - 2008 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA
T2 - 2008 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA
Y2 - 22 June 2008 through 25 June 2008
ER -