TY - GEN
T1 - Plagiarism detection in software designs
AU - Belkhouche, B.
AU - Nix, Anastasia
AU - Hassell, Johnette
PY - 2004
Y1 - 2004
N2 - Detecting plagiarism in software is a computationally complex process. At the same time it is critical, for the lack of a deterrent through detection may result in various losses. Several systems to detect plagiarism have been proposed. However, their lexically-based analysis is not powerfull enough and can be foiled with minimal efforts. To address their shortcomings, we have devised a detection framework with the following salient features: (1) designs, instead of code, are compared; (2) multi - level abstractions of the design are generated; and (3) comparison follows a stepwise process according to the abstraction levels. A comparison with existing systems shows that this strategy results in simpler algorithms and more accurate analyses.
AB - Detecting plagiarism in software is a computationally complex process. At the same time it is critical, for the lack of a deterrent through detection may result in various losses. Several systems to detect plagiarism have been proposed. However, their lexically-based analysis is not powerfull enough and can be foiled with minimal efforts. To address their shortcomings, we have devised a detection framework with the following salient features: (1) designs, instead of code, are compared; (2) multi - level abstractions of the design are generated; and (3) comparison follows a stepwise process according to the abstraction levels. A comparison with existing systems shows that this strategy results in simpler algorithms and more accurate analyses.
UR - http://www.scopus.com/inward/record.url?scp=33646022665&partnerID=8YFLogxK
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U2 - 10.1145/986537.986585
DO - 10.1145/986537.986585
M3 - Conference contribution
AN - SCOPUS:33646022665
SN - 1581138709
SN - 9781581138702
T3 - Proceedings of the Annual Southeast Conference
SP - 207
EP - 211
BT - Proceedings of the 42nd Annual Southeast Regional Conference, ACM-SE 42
T2 - 42nd Annual Southeast Regional Conference, ACM-SE 42
Y2 - 2 April 2004 through 3 April 2004
ER -