Abstract
This paper describes the production of atomic clusters and their subsequent assembly into conducting films and wires on insulating substrates. An Ultra-High-Vacuum compatible Inert Gas Aggregation cluster deposition system which allows in-situ electrical measurements to be performed on deposited cluster films has been developed. Accurate placement and dimensional control of cluster-assembled films has been achieved in this system using soft-landed Bi and Sb clusters and templated substrates prepared using standard optical and electron-beam lithography. Self-contacting cluster-assembled films produced on planar Si xN y and SiO 2 passivated Si substrates have provided a means to study conduction through percolating networks. Cluster-assembled wires with sub-100 nm widths have been positioned on templated Si xN y and SiO 2 passivated Si substrates. The reported assembly techniques rely upon controlling cluster reflection from substrates and factors which affect the probability of cluster-reflection are discussed.
Original language | English |
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Pages (from-to) | 1217-1222 |
Number of pages | 6 |
Journal | Physica Status Solidi (A) Applications and Materials Science |
Volume | 203 |
Issue number | 6 |
DOIs | |
Publication status | Published - May 1 2006 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
- Materials Chemistry