TY - GEN
T1 - Proxels for reliability assessment of future nano-architectures
AU - Lazarova-Molnar, Sanja
AU - Beiu, Valeria
AU - Ibrahim, Walid
N1 - Funding Information:
We thank Dr. D.W.S. Mok for his generous gifts of the antibodies for zeatin O-glycosyltransferase and the gene for zeatin O-glucosyltransferase. This research is supported by NIH grant GM 48680 to M.E.Z.
PY - 2007
Y1 - 2007
N2 - As devices are scaled towards the infinitesimal, the occurrences of defects and failures will certainly increase. This is a statement that has been repeated on numerous occasions recently. Therefore, accurate evaluation of reliability should be considered - besides area, power, and delay - as one additional design parameter of future nano-circuits. The goal of this paper is to evaluate the applicability (for this particular task) of the recently developed proxel-based method. The paper will include a background on the proxel-based method, its customization for the particular task at hand, as well as experimental results regarding its applicability towards reliability evaluation of nano-circuits. Index Terms - Nano-circuits, reliability, proxels, simulation, non-exponential distributions.
AB - As devices are scaled towards the infinitesimal, the occurrences of defects and failures will certainly increase. This is a statement that has been repeated on numerous occasions recently. Therefore, accurate evaluation of reliability should be considered - besides area, power, and delay - as one additional design parameter of future nano-circuits. The goal of this paper is to evaluate the applicability (for this particular task) of the recently developed proxel-based method. The paper will include a background on the proxel-based method, its customization for the particular task at hand, as well as experimental results regarding its applicability towards reliability evaluation of nano-circuits. Index Terms - Nano-circuits, reliability, proxels, simulation, non-exponential distributions.
KW - Nano-circuits
KW - Non-exponential distributions
KW - Proxels
KW - Reliability
KW - Simulation
UR - http://www.scopus.com/inward/record.url?scp=44949221580&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=44949221580&partnerID=8YFLogxK
U2 - 10.1109/IDT.2007.4437435
DO - 10.1109/IDT.2007.4437435
M3 - Conference contribution
AN - SCOPUS:44949221580
SN - 9781424418251
T3 - Proceedings - IDT'07 The 2nd International Design and Test Workshop
SP - 88
EP - 89
BT - Proceedings - IDT'07 The 2nd International Design and Test Workshop
T2 - 2nd international Design and Test Workshop, IDT 2007
Y2 - 16 December 2007 through 18 December 2007
ER -