Proxels for reliability assessment of future nano-architectures

Sanja Lazarova-Molnar, Valeria Beiu, Walid Ibrahim

Research output: Chapter in Book/Report/Conference proceedingConference contribution


As devices are scaled towards the infinitesimal, the occurrences of defects and failures will certainly increase. This is a statement that has been repeated on numerous occasions recently. Therefore, accurate evaluation of reliability should be considered - besides area, power, and delay - as one additional design parameter of future nano-circuits. The goal of this paper is to evaluate the applicability (for this particular task) of the recently developed proxel-based method. The paper will include a background on the proxel-based method, its customization for the particular task at hand, as well as experimental results regarding its applicability towards reliability evaluation of nano-circuits. Index Terms - Nano-circuits, reliability, proxels, simulation, non-exponential distributions.

Original languageEnglish
Title of host publicationProceedings - IDT'07 The 2nd International Design and Test Workshop
Number of pages2
Publication statusPublished - 2007
Event2nd international Design and Test Workshop, IDT 2007 - Cairo, Egypt
Duration: Dec 16 2007Dec 18 2007

Publication series

NameProceedings - IDT'07 The 2nd International Design and Test Workshop


Other2nd international Design and Test Workshop, IDT 2007


  • Nano-circuits
  • Non-exponential distributions
  • Proxels
  • Reliability
  • Simulation

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Condensed Matter Physics


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