TY - JOUR
T1 - Reliability bounds for two dimensional consecutive systems
AU - Beiu, Valeriu
AU - Dăuş, Leonard
N1 - Funding Information:
This research was supported by the European Union (SYMONE = SYnaptic MOlecular NEtworks for Bio-inspired Information Processing, FP7-ICT-318597 ), by Intel Co. (Ultra Low-Power Application-specific Non-Boolean Architectures, 2011-05-24G ), and by the National Research Foundation of the United Arab Emirates (Regular Structures in Noncommutative Algebra, 31S076 ).
Publisher Copyright:
© 2015 Elsevier Ltd.
PY - 2015/9/1
Y1 - 2015/9/1
N2 - In this paper we consider consecutive systems due to their potential for novel nano-architectures in general, where schemes able to significantly enhance reliability at low redundancy costs are expected to make a difference. Additionally, nanoscale communications are also expected to rely on structures and methods allowing to achieve better/lower transmission bit error rates. In particular, certain nano-technologies, like, e.g., nano-magnetic ones (but also nano-fluidic, molecular and even FinFETs), could be mapped onto consecutive systems, a well-established redundancy scheme. That is why this paper will start by briefly mentioning previous results for one dimensional linear consecutive-. k-out-of-. n: F systems with statistically independent components having the same failure probability q (i.i.d. components), before focusing on 2-dimensional consecutive systems. We shall introduce 2-dimensional consecutive systems and mention some variations, before going over a few upper and lower bounds for estimating their reliability. Afterwards, we shall present simulation results for particular 2-dimensional cases. These will show that some of the lower and upper bounds are able to perfectly match the exact reliability of 2-dimensional consecutive systems for the particular cases considered here. Conclusions and future directions of research are ending the paper.
AB - In this paper we consider consecutive systems due to their potential for novel nano-architectures in general, where schemes able to significantly enhance reliability at low redundancy costs are expected to make a difference. Additionally, nanoscale communications are also expected to rely on structures and methods allowing to achieve better/lower transmission bit error rates. In particular, certain nano-technologies, like, e.g., nano-magnetic ones (but also nano-fluidic, molecular and even FinFETs), could be mapped onto consecutive systems, a well-established redundancy scheme. That is why this paper will start by briefly mentioning previous results for one dimensional linear consecutive-. k-out-of-. n: F systems with statistically independent components having the same failure probability q (i.i.d. components), before focusing on 2-dimensional consecutive systems. We shall introduce 2-dimensional consecutive systems and mention some variations, before going over a few upper and lower bounds for estimating their reliability. Afterwards, we shall present simulation results for particular 2-dimensional cases. These will show that some of the lower and upper bounds are able to perfectly match the exact reliability of 2-dimensional consecutive systems for the particular cases considered here. Conclusions and future directions of research are ending the paper.
KW - 2-dimensional consecutive systems
KW - Consecutive systems
KW - Lower bounds
KW - Reliability
KW - Upper bounds
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U2 - 10.1016/j.nancom.2015.04.003
DO - 10.1016/j.nancom.2015.04.003
M3 - Article
AN - SCOPUS:84940788241
SN - 1878-7789
VL - 6
SP - 145
EP - 152
JO - Nano Communication Networks
JF - Nano Communication Networks
IS - 3
ER -