TY - GEN
T1 - Reliability modeling of circuits with multi-state aging gates
AU - Lazarova-Molnar, Sanja
AU - Beiu, Valeriu
PY - 2008
Y1 - 2008
N2 - As electronic devices are being scaled towards single digit nanometers, the frequency of errors that such nanocircuits will exhibit is expected to increase sharply. This is both a warning sign and a call to arms for including reliability/yield from the very early circuit design phases as a fourth optimization parameter (besides area, power and speed). In this paper we present an approach for reliability modeling of circuits, where every gate is considered as a discrete stochastic model. These models have (a few) discrete states, including an operating and a faulty state. This allows for treating the aging phenomena of circuits more realistically and obtaining more accurate reliability estimates.
AB - As electronic devices are being scaled towards single digit nanometers, the frequency of errors that such nanocircuits will exhibit is expected to increase sharply. This is both a warning sign and a call to arms for including reliability/yield from the very early circuit design phases as a fourth optimization parameter (besides area, power and speed). In this paper we present an approach for reliability modeling of circuits, where every gate is considered as a discrete stochastic model. These models have (a few) discrete states, including an operating and a faulty state. This allows for treating the aging phenomena of circuits more realistically and obtaining more accurate reliability estimates.
KW - Nano-circuits
KW - Proxels
KW - Reliability
KW - Simulation and stochastic methods
UR - http://www.scopus.com/inward/record.url?scp=84870984216&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84870984216&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84870984216
SN - 9781622763603
T3 - Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008
SP - 43
EP - 47
BT - Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008
T2 - Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008
Y2 - 16 June 2008 through 19 June 2008
ER -