TY - GEN
T1 - Reliability schemes for nano-communications
AU - Beiu, Valeriu
AU - Daus, Leonard
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/10/16
Y1 - 2015/10/16
N2 - In this paper we consider consecutive systems as a possible match for certain nano-technologies, as communicating at the nanoscale will need very reliable schemes (for achieving low transmission bit error rates). In fact, nano-technologies like, e.g., molecular, nano-fluidic, nano-magnetic (and even FinFETs), might be used for mapping consecutive systems. We shall start by mentioning previous results for 1D consecutive systems, before focusing on 2D ones. After introducing 2D consecutive systems, the paper will present bounds for estimating their reliability. Simulation results for particular 2D consecutive cases will show that some of the bounds are in fact exact. Finally, comparisons of classical and consecutive schemes will show their advantages, and will be followed by conclusions and future directions of research.
AB - In this paper we consider consecutive systems as a possible match for certain nano-technologies, as communicating at the nanoscale will need very reliable schemes (for achieving low transmission bit error rates). In fact, nano-technologies like, e.g., molecular, nano-fluidic, nano-magnetic (and even FinFETs), might be used for mapping consecutive systems. We shall start by mentioning previous results for 1D consecutive systems, before focusing on 2D ones. After introducing 2D consecutive systems, the paper will present bounds for estimating their reliability. Simulation results for particular 2D consecutive cases will show that some of the bounds are in fact exact. Finally, comparisons of classical and consecutive schemes will show their advantages, and will be followed by conclusions and future directions of research.
KW - Reliability
KW - bounds
KW - consecutive systems
UR - http://www.scopus.com/inward/record.url?scp=84959575743&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84959575743&partnerID=8YFLogxK
U2 - 10.1109/ECCTD.2015.7300038
DO - 10.1109/ECCTD.2015.7300038
M3 - Conference contribution
AN - SCOPUS:84959575743
T3 - 2015 European Conference on Circuit Theory and Design, ECCTD 2015
BT - 2015 European Conference on Circuit Theory and Design, ECCTD 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - European Conference on Circuit Theory and Design, ECCTD 2015
Y2 - 24 August 2015 through 26 August 2015
ER -