Reliability schemes for nano-communications

Valeriu Beiu, Leonard Daus

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper we consider consecutive systems as a possible match for certain nano-technologies, as communicating at the nanoscale will need very reliable schemes (for achieving low transmission bit error rates). In fact, nano-technologies like, e.g., molecular, nano-fluidic, nano-magnetic (and even FinFETs), might be used for mapping consecutive systems. We shall start by mentioning previous results for 1D consecutive systems, before focusing on 2D ones. After introducing 2D consecutive systems, the paper will present bounds for estimating their reliability. Simulation results for particular 2D consecutive cases will show that some of the bounds are in fact exact. Finally, comparisons of classical and consecutive schemes will show their advantages, and will be followed by conclusions and future directions of research.

Original languageEnglish
Title of host publication2015 European Conference on Circuit Theory and Design, ECCTD 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479998777
DOIs
Publication statusPublished - Oct 16 2015
EventEuropean Conference on Circuit Theory and Design, ECCTD 2015 - Trondheim, Norway
Duration: Aug 24 2015Aug 26 2015

Publication series

Name2015 European Conference on Circuit Theory and Design, ECCTD 2015

Other

OtherEuropean Conference on Circuit Theory and Design, ECCTD 2015
Country/TerritoryNorway
CityTrondheim
Period8/24/158/26/15

Keywords

  • Reliability
  • bounds
  • consecutive systems

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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