TY - GEN
T1 - Reliability the fourth optimization pillar of nanoelectronics
AU - Lazarova-Molnar, Sanja
AU - Beiu, Valeriu
AU - Ibrahim, Walid
PY - 2007
Y1 - 2007
N2 - This paper summarizes a strategy for the development of an EDA (Electronic Design Automation) tool which will support the design of future nano-circuits. The problem with the existing EDA tools is that they do not explicitly consider reliability as a design criterion. Those tools that do consider reliability are not intended for the nanoelectronic industry and are very limited in the types of failure models they can assess. Moreover, current indications show that moving towards nano-scale will significantly increase the failure rates. It follows that an improved EDA tool which would efficiently assess reliability (besides speed, power, area, etc.) is becoming a necessity. In this paper we detail a strategy and its methods that could ultimately lead to an EDA tool for realistic reliability evaluation of nano-circuits.
AB - This paper summarizes a strategy for the development of an EDA (Electronic Design Automation) tool which will support the design of future nano-circuits. The problem with the existing EDA tools is that they do not explicitly consider reliability as a design criterion. Those tools that do consider reliability are not intended for the nanoelectronic industry and are very limited in the types of failure models they can assess. Moreover, current indications show that moving towards nano-scale will significantly increase the failure rates. It follows that an improved EDA tool which would efficiently assess reliability (besides speed, power, area, etc.) is becoming a necessity. In this paper we detail a strategy and its methods that could ultimately lead to an EDA tool for realistic reliability evaluation of nano-circuits.
KW - EDA
KW - Fault models
KW - Nanoelectronics
KW - Reliability
KW - Validation
UR - http://www.scopus.com/inward/record.url?scp=60349129512&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=60349129512&partnerID=8YFLogxK
U2 - 10.1109/ICSPC.2007.4728258
DO - 10.1109/ICSPC.2007.4728258
M3 - Conference contribution
AN - SCOPUS:60349129512
SN - 9781424412365
T3 - ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications
SP - 73
EP - 76
BT - ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications
T2 - 2007 IEEE International Conference on Signal Processing and Communications, ICSPC 2007
Y2 - 14 November 2007 through 27 November 2007
ER -