TY - GEN
T1 - Review of reliability bounds for consecutive-k-out-of-n systems
AU - Beiu, Valeriu
AU - Daus, Leonard
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/11/26
Y1 - 2014/11/26
N2 - This paper reviews many lower and upper bounds for consecutive-k-out-of-n systems presented over the last three decades. The reason is a revived interest to accurately estimate the reliability of (very) large consecutive systems, where exact calculations can be challenging. Main examples are novel nano-architectures targeting FinFETs, nano-magnetic and molecular technologies (where accurate estimations of reliability are of high interest), as well as their associated nanoscale communications (where the reliability of transmission needs to be assessed), which map well onto (very) large consecutive systems.
AB - This paper reviews many lower and upper bounds for consecutive-k-out-of-n systems presented over the last three decades. The reason is a revived interest to accurately estimate the reliability of (very) large consecutive systems, where exact calculations can be challenging. Main examples are novel nano-architectures targeting FinFETs, nano-magnetic and molecular technologies (where accurate estimations of reliability are of high interest), as well as their associated nanoscale communications (where the reliability of transmission needs to be assessed), which map well onto (very) large consecutive systems.
UR - http://www.scopus.com/inward/record.url?scp=84919476426&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84919476426&partnerID=8YFLogxK
U2 - 10.1109/NANO.2014.6968048
DO - 10.1109/NANO.2014.6968048
M3 - Conference contribution
AN - SCOPUS:84919476426
T3 - Proceedings of the IEEE Conference on Nanotechnology
SP - 302
EP - 307
BT - Proceedings of the IEEE Conference on Nanotechnology
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 14th IEEE International Conference on Nanotechnology, IEEE-NANO 2014
Y2 - 18 August 2014 through 21 August 2014
ER -