Revisiting delay variations statistically through an example

Valeriu Beiu; Mihai Tache

doi:10.1109/SMICND.2015.7355200

Revisiting delay variations statistically through an example

Valeriu Beiu, Mihai Tache

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper details preliminary results for a novel statistical analysis, using the delay of an inverter (the basic element of SRAM cells) as an example. The results obtained are statistically meaningful, and should allow for more accurate, faster, and better yield estimates.

Original language	English
Title of host publication	2015 38th International Semiconductor Conference, CAS 2015 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	179-182
Number of pages	4
ISBN (Electronic)	9781479988624
DOIs	https://doi.org/10.1109/SMICND.2015.7355200
Publication status	Published - Dec 11 2015
Externally published	Yes
Event	38th International Semiconductor Conference, CAS 2015 - Sinaia, Romania Duration: Oct 12 2015 → Oct 14 2015

Publication series

Name	Proceedings of the International Semiconductor Conference, CAS
Volume	2015-December

Conference

Conference	38th International Semiconductor Conference, CAS 2015
Country/Territory	Romania
City	Sinaia
Period	10/12/15 → 10/14/15

Keywords

Statistical analysis
delay
inverter
variations

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/SMICND.2015.7355200

Cite this

Beiu, V., & Tache, M. (2015). Revisiting delay variations statistically through an example. In 2015 38th International Semiconductor Conference, CAS 2015 - Proceedings (pp. 179-182). Article 7355200 (Proceedings of the International Semiconductor Conference, CAS; Vol. 2015-December). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SMICND.2015.7355200

Revisiting delay variations statistically through an example. / Beiu, Valeriu; Tache, Mihai.
2015 38th International Semiconductor Conference, CAS 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2015. p. 179-182 7355200 (Proceedings of the International Semiconductor Conference, CAS; Vol. 2015-December).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Beiu, V & Tache, M 2015, Revisiting delay variations statistically through an example. in 2015 38th International Semiconductor Conference, CAS 2015 - Proceedings., 7355200, Proceedings of the International Semiconductor Conference, CAS, vol. 2015-December, Institute of Electrical and Electronics Engineers Inc., pp. 179-182, 38th International Semiconductor Conference, CAS 2015, Sinaia, Romania, 10/12/15. https://doi.org/10.1109/SMICND.2015.7355200

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Revisiting delay variations statistically through an example

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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