RF calibration of on-chip DfT chain by DC stimuli and statistical multivariate regression technique

Keyphrases

• Multivariate Regression 100%
• Design for Testability 100%
• RF Calibration 100%
• Parameter Variability 33%
• Calibration Scheme 33%
• 65nm CMOS 16%
• Detector Test 16%
• Package Design 16%
• Analog Circuits 16%
• Test Cost Reduction 16%
• Parametric Test 16%
• RF chip 16%
• Nanoscale CMOS 16%
• RF Circuits 16%
• On-chip Routing 16%
• ADC Test 16%
• Test Stimuli 16%
• Multiplexer 16%
• RF Detector 16%
• On-chip Test 16%
• RF Packaging 16%
• Cumulative Variation 16%
• CMOS Scaling 16%
• Technology Requirements 16%

Computer Science

• Artificial Neural Network 100%
• Parametric Test 100%
• Analog Circuit 100%
• Multiplexer 100%
• Design Package 100%

Engineering

• Testability 100%
• Package Design 16%
• Multiplexer 16%
• Test Time 16%
• Test Stimulus 16%
• Analog Circuit 16%
• Test Structure 16%
• Nanometre 16%