Sensitivity of reliability of logic gates

Azam Beg, Ifrah Jaffri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ever-shrinking dimensions of transistors in CMOS have caused the failure rates/probabilities to increase dramatically. Monte Carlo simulations are one way of estimation the failure probabilities, however, such simulations tend to be very time-consuming. A much speedier alternative is to use models for the estimation. This paper presents a method for creating the mathematical models for the probabilities of failures of CMOS logic gates/blocks. The models of five common gates are included, i.e., NAND3, NAND4, NOR3, NOR4 and OAI22. The models can also be used to study the sensitivity of the gates' failures to their individual transistors' failures. The presented technique is applicable to larger logic cells such as 28-transistor full-adders, etc. The given models are anticipated to be useful for Pareto-optimization of logic blocks, for instance, power-and-reliability, performance-and-reliability etc.

Original languageEnglish
Title of host publication2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-5
Number of pages5
ISBN (Electronic)9781538608722
DOIs
Publication statusPublished - Jun 28 2017
Event2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017 - Ras Al Khaimah, United Arab Emirates
Duration: Nov 21 2017Nov 23 2017

Publication series

Name2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017
Volume2018-January

Other

Other2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017
Country/TerritoryUnited Arab Emirates
CityRas Al Khaimah
Period11/21/1711/23/17

Keywords

  • CMOS
  • failure probability
  • failure rate
  • logic gate
  • mathematical model
  • reliability
  • sensitivity analysis
  • standard cell

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Instrumentation
  • Computer Science Applications

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