Stepwise correlation metric based discriminant analysis and multi-probe images fusion for face recognition

Zhen Lei, Shengcai Liao, Stan Z. Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Face recognition is a great challenge in practice. Subspace learning method is one of the dominant methods and has achieved great success in face recognition area. In subspace learning, many researches have found that correlation similarity (e.g. cosine distance) usually achieves better classification results than L2 distance with nearest neighbor (NN) classifier in Euclidean space. However, in traditional methods, most of them are devoted to optimize the objective function based on L2 distance, which is not coincident with the classification rule. It is reasonable to obtain better results by optimizing the objective function with correlation metric directly. In this paper, following traditional linear discriminant analysis (LDA), we redefine the between and with-in class scatter with correlation metric and propose an efficient Stepwise Correlation metric based Discriminant Analysis (SCDA) method to derive the sub-optimal discriminant subspace to be classified with correlation similarity. Moreover, we propose a novel weighted fusion mechanism to learn the optimal combination of multi-probe images to be classified. Extensive experiments on PIE and extended Yale-B databases validate the effectiveness of SCDA and the learning based weighted image fusion method.

Original languageEnglish
Title of host publication2009 IEEE 12th International Conference on Computer Vision Workshops, ICCV Workshops 2009
Pages147-153
Number of pages7
DOIs
Publication statusPublished - 2009
Externally publishedYes
Event2009 IEEE 12th International Conference on Computer Vision Workshops, ICCV Workshops 2009 - Kyoto, Japan
Duration: Sept 27 2009Oct 4 2009

Publication series

Name2009 IEEE 12th International Conference on Computer Vision Workshops, ICCV Workshops 2009

Conference

Conference2009 IEEE 12th International Conference on Computer Vision Workshops, ICCV Workshops 2009
Country/TerritoryJapan
CityKyoto
Period9/27/0910/4/09

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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