Abstract
The electronic band-structures of the strained-layer ZnS/ZnSe (001) superlattices (SLs) have been investigated using the sp3s* tight-binding method, which includes the strain and spin-orbit effects. The SL band-structures are studied versus the biaxial strain, layer thickness, and band offsets. The results suggest that the common-cation II-VI heterojunction exhibit a vanishingly small conduction-band offset (CBO). It is shown that the SL valence-band top state is always a heavy-hole localized within ZnSe slabs: whereas the conduction-band edge state (electron) is sensitive to the biaxial strain (or VBO). To assess the strain effects, we considered three differently strained SLs corresponding to the three substrates: (i) ZnSe; (ii) ZnS0.5Se0.5; and (iii) ZnS. The results show that all the studied SLs are of type-I except those strained to ZnS (case iii), that may exhibit type-I to type-II transition. One striking result obtained here is the existence of a critical VBO (Vc ≃ 0.76 eV) that predicts such transition, and particularly the fact that this value is independent of the strain state (substrate) (i.e. all SLs whose VBO is smaller than Vc are of type-I. else are of type-II). The comparison of our theoretical results to the photoluminescence experiments yields valuable information about the strain morphology as well as the structural and optical qualities of the experimental samples.
| Original language | English |
|---|---|
| Pages (from-to) | 961-968 |
| Number of pages | 8 |
| Journal | Journal of Physics D: Applied Physics |
| Volume | 36 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - Apr 21 2003 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Acoustics and Ultrasonics
- Surfaces, Coatings and Films
Fingerprint
Dive into the research topics of 'Strain effects in the common-cation II-VI heterostructures: Case of ZnS/ZnSe superlattices'. Together they form a unique fingerprint.Cite this
- APA
- Standard
- Harvard
- Vancouver
- Author
- BIBTEX
- RIS