Abstract
In this paper, we report on room temperature detection of terahertz radiation from strained-Si modulation-doped field-effect transistors. A non-resonant signal was observed with a maximum around the threshold voltage. The signal was interpreted due to the plasma wave nonlinearities in the channel. The intensity of the signal increases for the higher applied drain-to-source current. We also observed a dependence of the signal on the polarization of the incoming radiations.
Original language | English |
---|---|
Article number | 105006 |
Journal | Semiconductor Science and Technology |
Volume | 26 |
Issue number | 10 |
DOIs | |
Publication status | Published - Oct 12 2011 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry