Structural characterization and luminescence properties of ErxSc2-xSi2O7 prepared by RF sputtering

A. Najar; H. Omi; T. Tawara

Structural characterization and luminescence properties of Er_xSc_2-xSi₂O₇ prepared by RF sputtering

A. Najar, H. Omi, T. Tawara

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Polycrystalline Er_xSc_2-xSi₂O₇ compounds were fabricated using RF-sputtering by alternating Er₂O₃, Sc₂O₃ layers separated by SiO₂ layer. This new compounds presents excitation cross section at 980nm around 1.39×10^-21cm² with lifetime of 38 μs.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	QELS_Fundamental Science, CLEO_QELS 2014
Publisher	Optical Society of American (OSA)
ISBN (Print)	9781557529992
Publication status	Published - 2014
Externally published	Yes
Event	CLEO: QELS_Fundamental Science, CLEO_QELS 2014 - San Jose, CA, United States Duration: Jun 8 2014 → Jun 13 2014

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference

Conference	CLEO: QELS_Fundamental Science, CLEO_QELS 2014
Country/Territory	United States
City	San Jose, CA
Period	6/8/14 → 6/13/14

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

@inproceedings{19a601b24bef4557968136ba9c6ae3ae,

title = "Structural characterization and luminescence properties of ErxSc2-xSi2O7 prepared by RF sputtering",

abstract = "Polycrystalline ErxSc2-xSi2O7 compounds were fabricated using RF-sputtering by alternating Er2O3, Sc2O3 layers separated by SiO2 layer. This new compounds presents excitation cross section at 980nm around 1.39×10-21cm2 with lifetime of 38 μs.",

author = "A. Najar and H. Omi and T. Tawara",

year = "2014",

language = "English",

isbn = "9781557529992",

series = "Optics InfoBase Conference Papers",

publisher = "Optical Society of American (OSA)",

booktitle = "CLEO",

note = "CLEO: QELS_Fundamental Science, CLEO_QELS 2014 ; Conference date: 08-06-2014 Through 13-06-2014",

}

TY - GEN

T1 - Structural characterization and luminescence properties of ErxSc2-xSi2O7 prepared by RF sputtering

AU - Najar, A.

AU - Omi, H.

AU - Tawara, T.

PY - 2014

Y1 - 2014

N2 - Polycrystalline ErxSc2-xSi2O7 compounds were fabricated using RF-sputtering by alternating Er2O3, Sc2O3 layers separated by SiO2 layer. This new compounds presents excitation cross section at 980nm around 1.39×10-21cm2 with lifetime of 38 μs.

AB - Polycrystalline ErxSc2-xSi2O7 compounds were fabricated using RF-sputtering by alternating Er2O3, Sc2O3 layers separated by SiO2 layer. This new compounds presents excitation cross section at 980nm around 1.39×10-21cm2 with lifetime of 38 μs.

UR - http://www.scopus.com/inward/record.url?scp=84905508178&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84905508178&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84905508178

SN - 9781557529992

T3 - Optics InfoBase Conference Papers

BT - CLEO

PB - Optical Society of American (OSA)

T2 - CLEO: QELS_Fundamental Science, CLEO_QELS 2014

Y2 - 8 June 2014 through 13 June 2014

ER -