TY - GEN
T1 - Structural characterization and luminescence properties of ErxSc2-xSi2O7 prepared by RF sputtering
AU - Najar, A.
AU - Omi, H.
AU - Tawara, T.
PY - 2014
Y1 - 2014
N2 - Polycrystalline ErxSc2-xSi2O7 compounds were fabricated using RF-sputtering by alternating Er2O3, Sc2O3 layers separated by SiO2 layer. This new compounds presents excitation cross section at 980nm around 1.39×10-21cm2 with lifetime of 38 μs.
AB - Polycrystalline ErxSc2-xSi2O7 compounds were fabricated using RF-sputtering by alternating Er2O3, Sc2O3 layers separated by SiO2 layer. This new compounds presents excitation cross section at 980nm around 1.39×10-21cm2 with lifetime of 38 μs.
UR - http://www.scopus.com/inward/record.url?scp=84905508178&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84905508178&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84905508178
SN - 9781557529992
T3 - Optics InfoBase Conference Papers
BT - CLEO
PB - Optical Society of American (OSA)
T2 - CLEO: QELS_Fundamental Science, CLEO_QELS 2014
Y2 - 8 June 2014 through 13 June 2014
ER -