Structure of oxidized bismuth nanoclusters

K. J. Stevens, B. Ingham, M. F. Toney, S. A. Brown, J. Partridge, A. Ayesh, F. Natali

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)


Synchrotron X-ray diffraction has determined that Β-Bi2O3 is the dominant oxide phase covering hexagonal bismuth nanoclusters produced in an inert gas aggregation source. Simulated Debye-Scherrer patterns have indicated that the oxide is 20 5 Å thick on average, at the surface of 320 40 Å diameter clusters. A Williamson-Hall analysis of the peak broadening was used to measure the non-uniform strain in clusters. The oxidized clusters were in -0.11 0.06% uniform compressive strain compared with other clusters without oxides detectable by X-ray diffraction which only have a small tensile uniform strain. High-resolution transmission electron microscopy (HRTEM) and multislice image simulations indicated a Β-Bi2O3 thickness of 20-50 Å. The HRTEM micrographs show the relative orientation between the oxide and the cluster core.

Original languageEnglish
Pages (from-to)569-576
Number of pages8
JournalActa Crystallographica Section B: Structural Science
Issue number4
Publication statusPublished - Jul 17 2007
Externally publishedYes


  • High-resolution transmission electron microscopy
  • Oxidized bismuth nanoclusters
  • Peak broadening
  • Synchrotron X-ray diffraction

ASJC Scopus subject areas

  • General Biochemistry,Genetics and Molecular Biology


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