Abstract
Synchrotron X-ray diffraction has determined that Β-Bi2O3 is the dominant oxide phase covering hexagonal bismuth nanoclusters produced in an inert gas aggregation source. Simulated Debye-Scherrer patterns have indicated that the oxide is 20 5 Å thick on average, at the surface of 320 40 Å diameter clusters. A Williamson-Hall analysis of the peak broadening was used to measure the non-uniform strain in clusters. The oxidized clusters were in -0.11 0.06% uniform compressive strain compared with other clusters without oxides detectable by X-ray diffraction which only have a small tensile uniform strain. High-resolution transmission electron microscopy (HRTEM) and multislice image simulations indicated a Β-Bi2O3 thickness of 20-50 Å. The HRTEM micrographs show the relative orientation between the oxide and the cluster core.
Original language | English |
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Pages (from-to) | 569-576 |
Number of pages | 8 |
Journal | Acta Crystallographica Section B: Structural Science |
Volume | 63 |
Issue number | 4 |
DOIs | |
Publication status | Published - Jul 17 2007 |
Externally published | Yes |
Keywords
- High-resolution transmission electron microscopy
- Oxidized bismuth nanoclusters
- Peak broadening
- Synchrotron X-ray diffraction
ASJC Scopus subject areas
- Biochemistry, Genetics and Molecular Biology(all)