Using Bayesian networks to accurately calculate the reliability of complementary metal oxide semiconductor gates

Walid Ibrahim, Valeriu Beiu

    Research output: Contribution to journalArticlepeer-review

    41 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Using Bayesian networks to accurately calculate the reliability of complementary metal oxide semiconductor gates'. Together they form a unique fingerprint.

    Keyphrases

    Engineering

    Material Science