TY - GEN
T1 - Wear particle profile analysis
AU - Laghari, Mohammad Shakeel
AU - Ahmed, Faheem
PY - 2009
Y1 - 2009
N2 - Microscopic size wear debris transported through oil-lubricated systems provides important information about the condition of machinery, in particular the state of wear. Experts extract this information to monitor the operation of the machine to ensure safety, efficiency and economy of operation. The paper describes the analysis of microscopic wear particles by using computer vision and image processing techniques. The aim of the work is to develop an automated system to classify wear particles and thereby predict wear failure modes in machines. An interactive image analysis system WPIAS is devised which is used to process and store the quantitative information of particle profile (size, quantity, shape and edge details) analysis. Further analysis on the stored data is also described which permits systematic morphological analysis of the wear particles.
AB - Microscopic size wear debris transported through oil-lubricated systems provides important information about the condition of machinery, in particular the state of wear. Experts extract this information to monitor the operation of the machine to ensure safety, efficiency and economy of operation. The paper describes the analysis of microscopic wear particles by using computer vision and image processing techniques. The aim of the work is to develop an automated system to classify wear particles and thereby predict wear failure modes in machines. An interactive image analysis system WPIAS is devised which is used to process and store the quantitative information of particle profile (size, quantity, shape and edge details) analysis. Further analysis on the stored data is also described which permits systematic morphological analysis of the wear particles.
KW - Automation
KW - Computer vision
KW - Image analysis
KW - Tribology
KW - Wear particles
UR - http://www.scopus.com/inward/record.url?scp=70449633205&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=70449633205&partnerID=8YFLogxK
U2 - 10.1109/ICSPS.2009.152
DO - 10.1109/ICSPS.2009.152
M3 - Conference contribution
AN - SCOPUS:70449633205
SN - 9780769536545
T3 - 2009 International Conference on Signal Processing Systems, ICSPS 2009
SP - 546
EP - 550
BT - 2009 International Conference on Signal Processing Systems, ICSPS 2009
T2 - 2009 International Conference on Signal Processing Systems, ICSPS 2009
Y2 - 15 May 2009 through 17 May 2009
ER -