TY - GEN
T1 - Why nano-dsp will be fan-in constrained
AU - Ibrahim, Walid
AU - Beiu, Valeriu
AU - Lazarova-Molnar, Sanja
PY - 2007
Y1 - 2007
N2 - This paper studies for the first time the performance of von-Neumann multiplexing (vN-MUX) when stuck at fault model is considered. In this study, vN-MUX is applied to majority (MAJ) gates of small fan-ins (δ = 3, 5, 7, and 9), and respectively the corresponding redundancy factors (R = 6, 10, 14, and 18). This study is extremely important for a deeper understanding of vN-MUX, especially when considering the unreliable behavior of future nano-devices. The analysis confirms and enhances on well-known theoretical results, and is exact as being obtained using Bayesian network. Finally, the extension to device level will allow us to characterize vN-MUX with respect device failures for the first time ever. The results are very timely and are explaining a strange (non-linear) behavior of vN-MUX that was first reported two years ago (based on extensive Monte Carlo simulations).
AB - This paper studies for the first time the performance of von-Neumann multiplexing (vN-MUX) when stuck at fault model is considered. In this study, vN-MUX is applied to majority (MAJ) gates of small fan-ins (δ = 3, 5, 7, and 9), and respectively the corresponding redundancy factors (R = 6, 10, 14, and 18). This study is extremely important for a deeper understanding of vN-MUX, especially when considering the unreliable behavior of future nano-devices. The analysis confirms and enhances on well-known theoretical results, and is exact as being obtained using Bayesian network. Finally, the extension to device level will allow us to characterize vN-MUX with respect device failures for the first time ever. The results are very timely and are explaining a strange (non-linear) behavior of vN-MUX that was first reported two years ago (based on extensive Monte Carlo simulations).
KW - Bayesian networks
KW - Majority gates
KW - Nanoelectronics
KW - Reliability
KW - Von-Neumann multiplexing
UR - http://www.scopus.com/inward/record.url?scp=60349093524&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=60349093524&partnerID=8YFLogxK
U2 - 10.1109/ICSPC.2007.4728319
DO - 10.1109/ICSPC.2007.4728319
M3 - Conference contribution
AN - SCOPUS:60349093524
SN - 9781424412365
T3 - ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications
SP - 317
EP - 320
BT - ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications
T2 - 2007 IEEE International Conference on Signal Processing and Communications, ICSPC 2007
Y2 - 14 November 2007 through 27 November 2007
ER -